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Download scientific diagram | TEM images of the MgO sample: a, c) bright field, b, d) dark-field and e) electron diffraction pattern from publication: Structure studies on nanocrystalline powder of MgO xerogel prepared by sol-gel method | Structure studies were performed on nanocrystalline powder of MgO xerogel prepared by the sol-gel technique, producing high purity, chemically homogeneous materials of relatively high specific surface area. Magnesium methoxide was used as an MgO precursor. The wet gel was… | Magnesium Oxide, Powders and Magnesium | ResearchGate, the professional network for scientists.
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Electron Diffraction Pattern obtained by systematic tilting of BaTiO3 crystal Courtesy of SOUMITRA CHATTERJEE Image Details Instrument used: Tecnai Family Voltage: 300 kV Spot: 7 Detector: Gatan CCD camera (1K X 1K)
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An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Reflection high-energy electron diffraction is one of the most powerful tools used in surface structural analysis to monitor epitaxial growth. This book serves as an introduction to RHEED for beginners and details experimental and theoretical treatments for experts. First, the principles of electron diffraction are explained, with many examples of RHEED patterns described for beginners. The second part contains in-depth descriptions of RHEED theory. Finally, applications of RHEED are explained with many examples. Reflection high-energy electron diffraction is one of the most powerful tools used in surface structural analysis to monitor epitaxial growth. This book serves as an introduction to RHEED for beginners and details experimental and theoretical treatments for experts. First, the principles of electron diffraction are explained, with many examples of RHEED patterns described for beginners. The second part contains in-depth descriptions of RHEED theory. Finally, applications of RHEED are explained with many examples.
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| Author: Ayahiko Ichimiya, Philip I. Cohen | Publisher: Cambridge University Press | Publication Date: Feb 17, 2011 | Number of Pages: 366 pages | Language: English | Binding: Paperback | ISBN-10: 0521184029 | ISBN-13: 9780521184021
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This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached. • Author: P E Champness • ISBN:9781859961476 • Format:Paperback • Publication Date:2001-07-01
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This book is devoted to convergent-beam diffraction-a method capable of providing remarkably accurate crystallographic information. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed. A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed. • Author:
Jean- Paul Morniroli • ISBN:9782901483052 • Format:Paperback • Publication Date:2004-11-03
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Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten- sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J. • Author: Zhong-Lin Wang • ISBN:9781489915818 • Format:Paperback • Publication Date:2013-06-26
