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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas (de Gruyter Stem)
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Rapid Modal Analysis of Some Felsic Rocks from Calibrated X-ray Diffraction Patterns
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Electron Microscopy and Analysis
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Interferogram Analysis For Optical Testing (Optical Engineering Book 84)
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Fringe Pattern Analysis: 8-9 August 1989 San Diego, California (Proceedings of Spie)
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Introduction to X-Ray Powder Diffractometry
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MicroComputed Tomography: Methodology and Applications, Second Edition
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Introduction to Scanning Transm
ission Electron Microscopy (Royal Microscopical Society Microscopy Handbooks)
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Antenna Theory and Microstrip Antennas
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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
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Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping, Second Edition
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Nanosilicon: Properties, Synthesis, Applications, Methods of Analysis and Control
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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. • ISBN:9783540405191 • Format:Hardcover • Publication Date:2003-11-26
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Zeitschrift f\\u0026uuml;r Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift f\\u0026uuml;r Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography. Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials: Garmisch-Partenkirchen, October 7-9, 2007 (Paperback)
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Our Holographic Diffraction Gratings are highly efficient embossed Holographic Optical Elements (H.O.E.). Diffraction Gratings are used for the direct viewing and analysis of spectra from different gas tubes and other light sources. The quality of the spectrum produced from our gratings is the brightest possible with a minimum of distracting visual noise. Our gratings are the principal component in a spectroscope and are used for experiments pertaining to the study of light and color. Project a spectrum using an overhead projector or 35mm slide projector for spectrum demonstration purposes. Use in conjunction with colored film gels for additive and subtractive color demonstrations. Recommended for use with our Power Supply and Spectrum Gas Tubes.Minimum order 10 sheets.Choose From the Drop-Down Menu Above01503 – 13,500 lines per inch – Double Axis 6 x 12 01504 – 1000 lines per m/m – Linear 6 x 12 01505 – 500 lines per m/m – Linear 6 x 12
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Atomistic simulations based on Molecular Dynamics were used to model the lattice distortions in metallic nano-polycrystalline microstructures. Complex microstructures were generated with a new modified Voronoi tessellation method which provides a direct relation between generation parameters and statistical properties of the resulting model. Line Profile Analysis (LPA) was employed to retrieve the microstructure information from the powder diffraction patterns. The study provided a new point of view on the role of the grain boundary regions in nano-polycrystalline aggregates, exploring the interference eff
ects between different domains and between grain boundary and crystalline regions. Usual concepts of solid mechanics were brought in the atomistic models to describe the strain effects on the powder diffraction pattern. The new concept of Directional Pair Distribution Function (D-PDF) was developed. D-PDFs provide a representation of the strain field which is directly comparable with the results of LPA. The D-PDF opens a new chapter in powder diffraction as new insights and a more sound interpretation of the results are made possible with this new approach to diffraction LPA. Molecular Dynamics and X-Ray Powder Diffraction Simulations (Paperback)
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If you’re looking to do classroom experimentation with spectrum tubes and would like to do some spectral analysis, our double axis 13,500 line/in. diffraction grating slide is the right choice.Rainbow Symphony’s 2 inch by 2 inch slides have several advantages that make them the industry standard for education. Our lenses are constructed with quality and durability in mind, making it a good choice to put in the hands of a variety of learners. Each lens has also been optimized to eliminate distracting visual noise, which means you’ll get a clean view of the color spectrum each time you use it. Additionally, you’ll also find that our lenses are the brightest on the market, making visual observations even easier to discern.Education professionals appreciate our slides because they make their jobs easier. Each diffraction grating slide has a scale to help you measure wavelength in nanometers, making observations quick and simple to record. Educators also appreciate how seamlessly our slides work with overhead projectors and colored film gels as well.Teachers and students alike are sure to appreciate the high-caliber products from Rainbow Symphony. Don’t forget: buy in bulk and save even more!IMPORTANT: Minimum order for this item is 50 pieces at .40 each. To receive the quantity discounts advertised, you must add the quantity you’re ordering to the quantity box on the order page.
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